S650 Series in native TLC surpasses other cards with 1.6X higher endurance;
S750 Series in pSLC mode achieves 2X higher endurance

TAIPEI, Taiwan, July 13 (Bernama-GLOBE NEWSWIRE) --  ATP Electronics, the global leader in specialized storage and memory solutions, introduces its new 3D triple level cell (TLC) S750/S650 Series SD and microSD memory cards built for the rigors of non-stop video recording. They meet the high endurance, low latency, and built-to-last data storage requirements of dashcams and digital video recorders (DVRs), as well as surveillance systems, autonomous vehicles, and other write-intensive applications.

High Endurance Over 109K Hours¹ of Recording Time in Native TLC
Video evidence can prove critical in many scenarios; hence, it is very important for SD/microSD cards to record non-stop without compromising image quality and integrity. The S650 Series can record Full HD videos continuously up to 109,401 hours — far longer than similar cards marketed as “high endurance.” The S650 Series is based on 5K program/erase (P/E) cycles, which translate to 1.6X higher endurance than typical memory cards with 3K P/E cycles. The S750 Series, configured as pseudo single-level cell (pSLC) is based on 60K P/E cycles, while typical pSLC memory cards are rated for around 20K to 30K P/E cycles.

The following graph² shows the endurance simulation result of ATP S650 128 GB microSD compared with other high-endurance branded cards of the same capacity, in full HD mode.

High Endurance Maximum Recording Hours: ATP S650 vs. Other High-Endurance Cards
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Notes:
¹ Tested using 128 GB ATP S650 TLC card based on 13 Mbps (lowest bitrate of HD recording) in best-case/ideal scenario, with no other influencing factors.
² Information sourced by ATP from publicly available data.

• To record new data, the oldest data will be overwritten when the card is full.
• 1Mbps=1,000,000 bps

• Auto-Read Calibration (ARC). Over time and with constant use, NAND flash memory cells degrade, causing voltage shifts that increase bit error rates (BER). When the normal Read Retry function is not enough to recover the errors, a more precise "Auto Read Calibration" (ARC) is applied to assure data integrity at extreme temperature or degraded NAND cells.
• ATP Methodology for Advanced Card Analysis. ATP memory cards are IP67/IP57-certified and manufactured using System-in-Package (SiP) wafer/die process, making it difficult to do component analysis compared to SMT (surface- mount technology) process. ATP’s uniquely designed substrate and debug tool make this mission "possible."
  1. ATP-Developed Hardware Design - Substrate with reserved testing pin is available for future component analysis.
  2. Solder Mask Removal by Laser – Precise and efficient method to remove solder mask so as to reach the reserved testing pins on the substrate.
  3. ATP’s Own Customized Debug Tool - This is connected to the HW reserved testing pin and then linked to the SW analysis system.